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Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

文献类型: 外文期刊

作者: Guan, Wei 1 ; Shao, Jonathan 2 ; Zhao, Tingchang 3 ; Huang, Qi 1 ;

作者机构: 1.US Dept Agr, Agr Res Serv, US Natl Arboretum, Floral & Nursery Plants Res Unit, Beltsville, MD 20705 USA

2.US Dept Agr, Agr Res Serv, North East Area, Beltsville, MD USA

3.Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing, Peoples R China

期刊名称:MICROBIOLOGY RESOURCE ANNOUNCEMENTS ( 影响因子:0.8; 五年影响因子:0.8 )

ISSN: 2576-098X

年卷期: 2023 年 12 卷 1 期

页码:

收录情况: SCI

摘要: Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%. Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%.

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