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A novel layered culture device reveals spatial dynamics of root element uptake and optimal silicon application site for mitigating chromium uptake by rice

文献类型： 外文期刊

作者： Pang, Zhihao 1 ; Qiu, Li-Xue 1 ; Guan, Dong-Xing 1 ; Zeng, Xian 3 ; Wang, Yuxiao 4 ; Peng, Hongyun 1 ; Song, Alin 3 ; Liang, Yongchao 1 ;

作者机构： 1.Zhejiang Univ, Coll Environm & Resource Sci, Minist Educ, Key Lab Environm Remediat & Ecol Hlth, Hangzhou 310058, Peoples R China

2.Natl Univ Singapore, Dept Chem & Biomol Engn, Singapore, Singapore

3.Chinese Acad Agr Sci, Inst Agr Resources & Reg Planning, Key Lab Plant Nutr & Fertilizer, Minist Agr, Beijing 100081, Peoples R China

4.Zhejiang Univ, Coll Life Sci, State Key Lab Plant Physiol & Biochem, Hangzhou 310027, Peoples R China

关键词： Layered culture device; Root segments; chromium; Silicon; Rice

期刊名称：JOURNAL OF ENVIRONMENTAL MANAGEMENT （ 影响因子：8.4； 五年影响因子：8.6 ）

ISSN： 0301-4797

年卷期： 2025 年 373 卷

页码：

收录情况： SCI

摘要： Understanding root uptake mechanisms for various elements is crucial for optimizing heavy metal remediation strategies and enhancing plant-nutrient interactions. However, simple and effective methods to differentiate the contributions of specific root segments in element uptake are lacking. Here, we developed a layered culture device consisting of a culture box and a plant suspension mechanism, which isolates different root segments through solid media and waterproof coating. Then, we used the device to investigate the roles of distinct root segments (0-1 cm and 1-2 cm from the tip) in heavy metal chromium (Cr) and beneficial element silicon (Si) uptake in rice. The results indicated that the 0-1 cm root segment contributed approximately 58% of leaf Cr(VI), with higher efflux compared to the 1-2 cm segment. Conversely, the 1-2 cm root segment served as the primary source of leaf Si and Cr(III), accounting for 62% and 54%, respectively. The translocation factors for Cr(VI) were similar for both segments (0.039 and 0.032), while the Cr(III) translocation factor for the 0-1 cm root segment (0.061) was 2.8 times that of the 1-2 cm segment. Notably, Si application to the 0-1 cm segment most effectively alleviated Cr (III) and Cr (VI) stress, boosting shoot length, fresh weight, and chlorophyll concentration and reducing Cr concentrations in roots and leaves by 24.7%-65.7%. In contrast, Si application to the 1-2 cm segment had minimal impact on rice growth or Cr uptake. These results suggest a deep Si application strategy for remediating Cr-contaminated soil. The innovative device provides a scientific foundation for distinguishing element uptake contributions of different root segments and enhancing the utilization efficiency of remediation materials and nutrient management in agriculture.

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