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Fine mapping of a stripe rust resistance gene YrZM175 in bread wheat

文献类型： 外文期刊

作者： Wu, Jingchun 1 ; Xu, Dengan 3 ; Fu, Luping 4 ; Wu, Ling 6 ; Hao, Weihao 1 ; Li, Jihu 7 ; Dong, Yan 2 ; Wang, Fengju 2 ; Wu, Yuying 8 ; He, Zhonghu 2 ; Si, Hongqi 1 ; Ma, Chuanxi 1 ; Xia, Xianchun 1 ;

作者机构： 1.Anhui Agr Univ, Coll Agron, 130 Changjiang West Rd, Hefei 230036, Anhui, Peoples R China

2.Chinese Acad Agr Sci CAAS, Natl Wheat Improvement Ctr, Inst Crop Sci, 12 Zhongguancun South St, Beijing 100081, Peoples R China

3.Qingdao Agr Univ, Coll Agron, 700 Changcheng Rd, Qingdao 266109, Shandong, Peoples R China

4.Yangzhou Univ, Jiangsu Key Lab Crop Genet & Physiol, Jiangsu Key Lab Crop Cultivat & Physiol, Agr Coll, Yangzhou 225009, Jiangsu, Peoples R China

5.Yangzhou Univ, Jiangsu Coinnovat Ctr Modern Prod Technol Grain C, Yangzhou 225009, Jiangsu, Peoples R China

6.Sichuan Acad Agr Sci, Crop Res Inst, 4 Shizishan Rd, Chengdu 610011, Sichuan, Peoples R China

7.Shandong Acad Agr Sci, Crop Res Inst, 202 Gongye North Rd, Jinan 250100, Shandong, Peoples R China

8.Henan Agr Univ, Coll Agron, 63 Agr Rd, Zhengzhou 450002, Henan, Peoples R China

9.CAAS, Int Maize & Wheat Improvement Ctr CIMMYT China Of, Beijing 100081, Peoples R China

期刊名称：THEORETICAL AND APPLIED GENETICS （ 影响因子：5.574； 五年影响因子：5.662 ）

ISSN： 0040-5752

年卷期： 2022 年 135 卷 10 期

页码：

收录情况： SCI

摘要： Key message A stripe rust resistance gene YrZM175 in Chinese wheat cultivar Zhongmai 175 was mapped to a genomic interval of 636.4 kb on chromosome arm 2AL, and a candidate gene was predicted. Stripe rust, caused by Puccinia striiformis f. sp. tritici (PST), is a worldwide wheat disease that causes large losses in production. Fine mapping and cloning of resistance genes are important for accurate marker-assisted breeding. Here, we report the fine mapping and candidate gene analysis of stripe rust resistance gene YrZM175 in a Chinese wheat cultivar Zhongmai 175. Fifteen F-1, 7,325 F-2 plants and 117 F-2:3 lines derived from cross Avocet S/Zhongmai 175 were inoculated with PST race CYR32 at the seedling stage in a greenhouse, and F-2:3 lines were also evaluated for stripe rust reaction in the field using mixed PST races. Bulked segregant RNA-seq (BSR-seq) analyses revealed 13 SNPs in the region 762.50-768.52 Mb on chromosome arm 2AL. By genome mining, we identified SNPs and InDels between the parents and contrasting bulks and mapped YrZM175 to a 0.72-cM, 636.4-kb interval spanned by YrZM175-InD1 and YrZM175-InD2 (763,452,916-764,089,317 bp) including two putative disease resistance genes based on IWGSC RefSeq v1.0. Collinearity analysis indicated similar target genomic intervals in Chinese Spring, Aegilops tauschii (2D: 647.7-650.5 Mb), Triticum urartu (2A: 750.7-752.3 Mb), Triticum dicoccoides (2A: 771.0-774.5 Mb), Triticum turgidum (2B: 784.7-788.2 Mb), and Triticum aestivum cv. Aikang 58 (2A: 776.3-778.9 Mb) and Jagger (2A: 789.3-791.7 Mb). Through collinearity analysis, sequence alignments of resistant and susceptible parents and gene expression level analysis, we predicted TRITD2Bv1G264480 from Triticum turgidum to be a candidate gene for map-based cloning of YrZM175. A gene-specific marker for TRITD2Bv1G264480 co-segregated with the resistance gene. Molecular marker analysis and stripe rust response data revealed that YrZM175 was different from genes Yr1, Yr17, Yr32, and YrJ22 located on chromosome 2A. Fine mapping of YrZM175 lays a solid foundation for functional gene analysis and marker-assisted selection for improved stripe rust resistance in wheat.

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