Development of a SCAR marker by inter-simple sequence repeat for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kuhn
文献类型: 外文期刊
作者: Gao, L. 1 ; Chen, W. Q. 1 ; Liu, T. G. 1 ;
作者机构: 1.CAAS, State Key Lab Biol Plant Dis & Insect Pests, Inst Plant Protect, Beijing 100193, Peoples R China
关键词: detection limit;genetic variation
期刊名称:FOLIA MICROBIOLOGICA ( 影响因子:2.099; 五年影响因子:2.131 )
ISSN:
年卷期:
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收录情况: SCI
摘要: Dwarf bunt of wheat, caused by Tilletia controversa Kuhn, is a destructive disease on wheat as well as an important internationally quarantined disease in many countries. The primer ISSR818 generated a polymorphic pattern displaying a 867-bp DNA fragment specific for T. controversa. The marker was converted into a sequence characterized amplified region (SCAR), and specific primers (TCKSF3/TCKSR3) designed for use in PCR detection assays; they amplified a unique DNA fragment in all isolates of T. controversa but not in the related pathogens. The detection limit with the primer set (TCKSF3/TCKSR3) was 5 ng of DNA which could be obtained from 5.5 mu g of teliospores in a 25-mu L PCR reaction mixture.
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