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Detection of resistance loci to English grain aphid in common wheat

文献类型： 外文期刊

作者： Zeng Zhankui 1 ; Han Zhipeng 1 ; Wang Chunping 1 ; Wang Zhenghong 1 ; Guo Cheng 1 ; Wang Liming 1 ; Gao Li 3 ;

作者机构： 1.Henan Univ Sci & Technol, Coll Agron, 263 Kaiyuan Rd, Luoyang 471023, Henan, Peoples R China

2.Shennong Lab, Zhengzhou 450002, Henan, Peoples R China

3.Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing 100193, Peoples R China

期刊名称：CROP SCIENCE （ 影响因子：2.763； 五年影响因子：2.856 ）

ISSN： 0011-183X

年卷期： 2022 年 62 卷 6 期

页码：

收录情况： SCI

摘要： The English grain aphid (Sitobion avenae F.) causes significant yield and quality losses in wheat (Triticum aestivum L.) worldwide, and the use of insect-resistant wheat cultivars reduces the loss level. The present study aimed to identify quantitative trait loci (QTL) and perform putative candidate gene evolutionary analysis for English grain aphid resistance in 261 F-2:5 recombinant inbred lines (RILs) derived from the cross Amigo/XN1376. The RIL population and parents were genotyped with the Wheat 55K single nucleotide polymorphism (SNP) array. A total of 14,694 polymorphic SNPs were used to construct a genetic linkage map. One major effect of QTL was detected in F-2:5 RILs and was located on chromosome 3DL, explained 19.33% phenotypic variance, temporarily designated as QSa3.haust-3D. It was located in a 2.73 Mb, flanked by markers AX-109429351 and AX-110834100, from 550.25 to 552.98 Mb according to Chinese Spring reference genome. This region contained 39 annotated genes. Eight putative candidate genes for resistance to English grain aphid were identified among these genes. The QTL with closely linked SNP markers could be useful for marker-assisted selection for resistance to English grain aphid for wheat breeding.

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